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Brand | Anritsu |
---|---|
Model | 680 B Series |
Category | Portable Generator |
Language | English |
Defines the scope and content of the maintenance manual for 680XXB/681XXB generators.
Provides an overview of the manual's content, including descriptions, manuals, options, and maintenance levels.
Describes the Series 680XXB/681XXB generators as microprocessor-based, synthesized signal sources.
Explains the unique six-digit ID number assignment and its importance for ordering parts and correspondence.
Details the availability and features of the electronic manual on CD ROM, including Acrobat Reader.
Lists the four-manual set: Operation, GPIB Programming, SCPI Programming, and Maintenance Manuals.
Lists available instrument options such as Rack Mounting, Step Attenuators, and High Power Output.
Outlines the maintenance procedures including troubleshooting, repair, calibration, and preventive maintenance.
Describes the procedure for cleaning the fan honeycomb filter to ensure adequate ventilation and prevent overheating.
Details precautions for handling static-sensitive components to prevent damage.
Explains how to change the instrument's startup configuration from operate to standby mode.
Lists recommended test equipment for performance verification, calibration, and troubleshooting procedures.
Describes ANRITSU's exchange assembly program for defective subassemblies and RF components.
Lists replaceable subassemblies and RF components covered by the exchange program and common parts.
Provides brief functional descriptions of major subsystems, operation of frequency synthesis, ALC, and RF deck.
Identifies and describes the distinct subsystems that make up the instrument.
Describes the CPU and interface PCBs that control instrument functions, memory, and communication.
Details the front panel subsystems including PCB, control PCB, and LCD display, interfacing with the CPU.
Explains the subsystem for phase-lock control of output frequency using four phase-lock loops.
Describes the PCB providing frequency tuning voltages and band select signals for YIG driver and SDM/SQM.
Details the PCB supplying tuning current and bias voltages for the YIG-tuned oscillator and down converter.
Covers the subsystem for automatic level control, AM, and square wave modulation of RF output signals.
Describes elements related to RF signal generation, modulation, and control, including oscillator and converters.
Explains the subsystem that supplies regulated DC voltages to the instrument circuits.
Describes interface circuits for rear panel connectors, including BNC, AUX I/O, GPIB, and SERIAL I/O.
Details the frequency synthesis subsystem's phase-lock control and operation of four phase-lock loops.
Explains the purpose and operation of phase-lock loops for controlling oscillator frequency accuracy and stability.
Describes the overall operation of the frequency synthesis subsystem, including YIG-tuned oscillator control.
Details how RF output frequencies are generated from the YIG-tuned oscillator across various ranges.
Explains how frequency modulation of the RF output is performed using external signals.
Describes broad-band and narrow-band analog frequency sweeps and their phase-lock correction.
Explains digital frequency sweeps consisting of discrete, synthesized steps between frequencies.
Details the subsystem for automatic level control (ALC) and modulation (AM, Square Wave) of RF output.
Describes how the ALC loop detects RF output level and uses feedback for level control.
Explains how amplitude modulation is accomplished by summing external modulating signals into the ALC loop.
Describes the mode where the CPU steps the RF output through a range of levels for identical frequency sweeps.
Explains square wave modulation by turning RF output on/off using internally generated or external inputs.
Describes the purpose and configurations of the RF deck assembly for generating CW and swept RF signals.
Details the variations in RF deck assemblies based on instrument model and frequency range.
Describes the oscillator containing two oscillators covering 2-8.4 GHz and 8.4-20 GHz, driven by FM and main tuning currents.
Explains how the modulator provides power level control and AM/square wave modulation for RF output.
Details routing of RF signals via PIN switches to low-pass filters and signal coupling for down conversion.
Describes the assembly containing a 6.5 GHz VCO for generating 0.01 to 2 GHz RF output frequencies.
Details the assembly providing improved phase noise across 0.5 to 2.2 GHz frequency range.
Explains the module used to double fundamental frequencies for outputting 20 to 40 GHz RF signals.
Describes the module used to quadruple fundamental frequencies for producing 40 to 65 GHz RF output.
Explains how RF output signal is detected and fed back to ALC circuitry for level control.
Details the optional step attenuator providing up to 110 dB attenuation in 10 dB steps.
Contains tests to verify generator performance against specifications, supporting all models and options.
Provides a list of recommended test equipment for performance verification procedures.
Offers sample test records for documenting instrument performance and initial test results.
Explains references to specific labels for controls, connectors, and test equipment used in procedures.
Lists models and their maximum leveled output power levels for test procedure reference.
Verifies the 10 MHz time base aging specification using an internal crystal oscillator.
Tests the frequency synthesis circuits, divided into coarse/YIG loop and fine loop tests.
Verifies spurious signal specifications for RF output signals from 0.01 to 2 GHz.
Verifies harmonic specifications for RF output signals from 2 to 20 GHz.
Verifies single sideband phase noise specifications by mixing DUT output with a LO.
Verifies generator's power level specifications through accuracy and flatness tests.
Provides procedures for calibrating generators due to out-of-tolerance conditions or component replacement.
Lists recommended test equipment for calibration procedures, including front panel control settings.
Offers sample calibration test records for documenting instrument calibration results.
Lists calibrations required after replacing specific subassemblies or RF components.
Explains labels for equipment interconnections and control settings used in calibration procedures.
Details the initial setup for calibration, including PC interfacing and Windows 3.1/95 configuration.
Provides steps for initial calibration of coarse loop, fine loop, frequency instruction, and DVM circuitry.
Details procedures to adjust Switched Filter Shaper Amplifier gain for consistent level gain.
Describes automated test system calibration for power output accuracy and storage of correction factors.
Explains ALC Slope DAC calibration to adjust for increasing/decreasing output power-vs-frequency.
Details procedure for ALC Bandwidth calibration to compensate for modulator gain variations.
Provides steps to calibrate AM Calibration DAC and AM Meter circuit for input sensitivities.
Details procedures for FM calibration, adjusting FM Calibration DAC for input sensitivities in various modes.
Provides information for troubleshooting malfunctions and fault isolation to replaceable subassemblies.
Lists recommended test equipment for troubleshooting procedures, referencing Chapter 1.
Summarizes error, warning, and status messages indicating malfunctions or operating conditions.
Details internal diagnostics that perform brief go/no-go tests on instrument PCBs and assemblies.
Lists and describes error, warning, and status messages displayed during normal instrument operation.
Provides troubleshooting procedures for malfunctions that cause non-operational states or RF output issues.
Offers procedures for isolating malfunctions to replaceable subassemblies or RF components.
Illustrates the location of connectors and test points on the instrument for troubleshooting.
Provides procedures for gaining access to major assemblies, subassemblies, and components for troubleshooting.
Details the step-by-step process for removing and replacing the instrument's chassis covers.
Provides instructions for removing and replacing the front panel assembly, including PCBs and rotary knob.
Describes removal and replacement of specific PCBs located in the RF housing.
Details the procedure for removing and replacing the A7 YIG Loop PCB from the main card cage.
Provides instructions for removing and replacing the A9, A10, A11, or A12 PCBs in the main card cage.
Describes removal and replacement of PCBs located in the main card cage, including heat sink subassemblies.
Details the procedure for removing and replacing the A16 or A17 CPU PCBs in the CPU housing assembly.
Provides instructions for removing and replacing PCBs in the power supply housing assembly.
Details the process for removing and replacing the rear panel assembly, including PCBs and fan assembly.
Provides instructions for removing and replacing the A21 Line Filter/Rectifier PCB on the rear panel assembly.
Details the procedure for removing and replacing the BNC/AUX I/O Connector PCB on the rear panel assembly.
Explains the process for removing and replacing the fan assembly located on the rear panel assembly.
Introduces test records for Performance Verification and Calibration, providing a history of instrument performance.
Test record for verifying the 68037B/68137B time base aging specification.
Test records for measuring coarse loop/YIG loop and fine loop frequencies for synthesis tests.
Test records for measuring spurious signals for RF output signals <2 GHz.
Test records for measuring phase noise levels at specified offsets for various frequencies.
Test records for measuring power level accuracy and flatness across frequency ranges.
Records for preliminary calibration steps including DVM, loops, and DAC calibrations.
Records for Log Amplifier Zero, Limiter DAC, and Shaper DAC adjustments.
Records for ALC Slope DAC adjustment for frequencies <2 GHz and >2 GHz.
Records for ALC Bandwidth calibration and storing DAC setting values.
Records for FM Meter, Wide/Narrow Sensitivity, and Rear Panel Input Gain calibrations.