dynabook Satellite Pro L50-G - Analyzing the problem

3.2.3 Memory Test 3 Diagnostic Programs
9 Satellite Pro L50-G / dynabookP*-C* MaintenanceManual
The test item is to ensurethat there is no opencircuitry issuein memory chip. It
will wire eachmemory addressonebit ‘0’ (likes a data0 working) andreadfrom
memory to check the write result.
4. Address Test
This test item is to check short andopen issueon memory addresslines. It will
write the addressto memory and check the write result by read.
5. Random Data Test
This test item is to check whether the memory could be correctly accessedwith
randomized data andrandomized memory address.
6. Checker Board Test
This test item is to check whether the system memory that could be accessed
correctly through writing andreading with a seriesof designedpattern data.
Parameterformat:
Lo-byte and hi-byte are composedwith 0101(0x5) and 1010 (0xA)
Parameterlength: Byte
7. Memory Copy Test
This test item is to check whether the memory copy works normally.
Copy Size: Byte
8. Bus Noise Test
This test item is to check whether the busnoiseworks normally.
Parameterformat:
0x00 and 0xff
9. RandomIncrement Test
This test item is to check whether the memory could be correctly accessedwith
randomized memory addressand a series of incremental data.
10. PatternBS High Test
This test item is to check whether the system memory that could be accessed
correctly through writing andreading with a seriesof designedpattern data.