Honeywell ST 700 - Diagnostics

Page 90 ST 700 Series HART/DE Option User’s Manual Revision 4.0
10.3 DE Diagnostic Messages
Table 30 lists and describe DE diagnostics.
Table 30 – DE Diagnostics
Diagnostics Type
Diagnostics
Details/Resolution
Critical
(continued)
NVM fault
Possible causes:
The NVM in the Sensor board is corrupt
The NVM in the Electronics module is corrupt
Resolution:
Reset the device. If the problem persists,
replace the Meter Body.
RAM fault
Possible causes:
The RAM in the Sensor board is corrupt
The RAM database in the Sensor board is
compromised
Resolution:
Reset the device. If the problem persists,
replace the Meter Body.
MDU/DAC
compensation fault
Possible causes:
This status is caused by one of the following
problems:
 DAC SPI fault
 DAC PEC fault
 DAC Temperature above 140C
 DAC VLOOP (loop voltage)low
 DAC control word write fault
Resolution:
Verify the environment temperature is within
specification. Take steps to insulate Meter Body
from temperature source.
If problem persists, replace Electronics Module.
Suspect input
Possible causes:
Pressure, Meter Body Temperature and/or
Static Pressure input are extremely out of range
such that the value is suspect.
Resolution:
Verify that all inputs are within specifications.
Reset the device. If the problem persists,
replace the Meter Body.
Characterization prom
fault or bad checksum
Possible causes:
Sensor characterization is corrupt or
there is a Sensor firmware failure
Resolution:
Reset the device. If the problem persists,
replace the Meter Body.
Meter body failure
Possible causes:
 Meter body failure
 Sensor communication timeout
 Sensor firmware flow failure