Horiba Scientific FluoroMax-4 User Manual

Overview of the spectrofluorometer systems, their components, and the difference between models.

Outline of the manual's chapter structure and the topics covered in each section.

General safety precautions and symbol definitions for instrument operation.

Hazards associated with UV light, health effects, and necessary protective measures.

Dangers related to xenon lamps, including burns, fire, and radiation exposure.

Statement of conformity with EMC and Low Voltage Directives.

Essential safety training for all instrument users, covering radiation and chemical handling.

Physical space, load-bearing capacity, and overhead clearance needed for instrument setup.

Temperature, humidity, and dust level specifications for optimal instrument operation.

Power input specifications, voltage range, frequency, and required outlets.

Procedures for safely removing the instrument from its packaging and initial setup.

Method for running FluorEssence™ software without the instrument connected.

Basic explanation of the spectrofluorometer's function and purpose.

Principles of excitation, emission, and detection in spectrofluorometry.

Diagram and explanation of the instrument's optical components.

Description of the signal and reference detectors used in the system.

Overview of the instrument's internal electronics and control boards.

Guide to turning on the system, checking calibration, and setting up experiments.

Location and function of the instrument's main power switch.

Step-by-step procedure for powering up the instrument and associated peripherals.

Routine checks for calibration, repeatability, and throughput before daily use.

Procedure to verify excitation wavelength calibration using a xenon lamp scan.

Procedure to verify emission wavelength calibration using a water Raman scan.

Overview of special buttons in FluorEssence™ for data recording and presentation.

Selecting experiment types and subtypes using the main experiment menu.

Resetting experiment to previous settings with minor hardware modifications.

Rerunning the last loaded experiment automatically without changes.

Extracting emission profiles from excitation-emission matrix data.

Automating a series of experiments with adjustable repeats and delays.

Adjusting experimental parameters in real time and viewing their effects.

Generating a calibration curve from collected data for analytical measurements.

Procedure for finding optimal excitation and emission wavelengths for unknown samples.

Incorporating dark offset, blank subtraction, and correction files for accurate data.

Detailed procedures for cleaning sample cuvettes to minimize background contributions.

Guidelines for preparing solution and solid samples for analysis.

Techniques to enhance data quality, including integration time and averaging.

Procedure for selecting the best integration time based on signal intensity.

Method to improve signal-to-noise ratio by averaging multiple scans.

Adjusting slit widths to control spectral resolution and light intensity.

Using Origin® software for spectral smoothing to improve data appearance.

Removing system-related spectral information for accurate sample property representation.

Overview of basic maintenance procedures and system integrity checks.

Procedure for replacing the instrument's xenon lamp.

Safety warnings related to lamp housing, high voltage, and hot components.

Step-by-step guide for safely replacing the xenon lamp.

Instructions for updating the instrument's firmware using the installation CD.

Interpreting lamp and water Raman spectra to identify and resolve instrument problems.

Diagnosing issues such as contaminated water or incorrect slits using water Raman scans.

Steps to follow when problems persist or are not listed, including contacting support.

Explanation of spectral correction factors for system components to eliminate response characteristics.

Procedures for creating new emission correction factor files using a standard lamp.

Steps to calculate emission correction factors using irradiance values and standard lamp data.

Applying acquired correction files (xcorrect, mcorrect) in FluorEssence™ system configuration.

Information regarding the production and use of excitation correction factors.

Overview of the phosphorimeter feature included in the FluoroMax®-4P.

Explanation of how the phosphorimeter works for phosphorescence measurements.

Steps involved in acquiring phosphorimeter data using pulsed light.

Key parameters governing phosphorimeter experiments like Initial Delay and Sample Window.

Uses of the phosphorimeter, including phosphorescence decay curves and kinetic analysis.

Steps for analyzing phosphorescence decay curve data using curve fitting.

Procedure for replacing the phosphorimeter's xenon flash lamp.

Overview of polarized emission measurements and their applications.

Principles of photoselection, molecular rotation, and anisotropy calculations.

Description of L-format and T-format polarization measurement setups.

Using specific polarizer angles to eliminate rotational artifacts in spectra.

Information on pre-installation and proper handling of polarizers.

Verifying polarizer alignment using scattering solutions and software utilities.

Step-by-step procedure for performing polarizer alignment using software.

Using the software routine for automatic polarizer calibration.

Performing polarization measurements at fixed excitation and emission wavelengths.

Common issues and solutions related to polarizer operation and alignment.

Overview of the spectrofluorometer system's main components and specifications.

Detailed specifications for the FluoroMax®-4 and -4P spectrofluorometer systems.

Technical specifications specific to the phosphorimeter module.

Specifications for the Time-correlated single-photon counting upgrade.

Recommended hardware and operating system specifications for the control computer.

Information regarding FluorEssence™ and Multigroup data acquisition software.

Comprehensive list of available accessories with models and page references.

Accessory for low-temperature sample measurements using liquid nitrogen.

Fused silica cell ideal for on-line monitoring of fluorescent samples.

Kit for calibrating spectral response using NIST-traceable standards.

Accessory for remote sensing of samples outside the standard compartment.

Accessory for temperature-controlled sample measurements (-20°C to +80°C).

Holder designed for solid samples such as films, powders, and fibers.

Replacement xenon lamp providing excitation light from 240 nm to 850 nm.

Accessory for scanning multiple samples in microplates using FluorEssence™.

Upgrade for pico- and nanosecond lifetime measurements with TCSPC.

Accessory for precise temperature control of samples (-25°C to +80°C).

Cable for manual triggering of fluorescence system scans via a BNC connector.

Accessory for creating special sample atmospheres like dry nitrogen.

Transition of a molecule from ground to excited singlet state.

Measure of light absorption by a substance, related to concentration.

Measurement of fluorescence polarization related to molecular motion.

Automated device for rotating polarizers for anisotropy measurements.

Wavelength range spread per slit width, dependent on monochromator optics.

Component isolating excitation beam wavelengths.

Light emission from excited molecules returning to ground state.

Time duration for collecting detector data points.

Emission of light from triplet state to ground state.

Software application for real-time system setup optimization.

Book on molecular biological systems and dynamics.

Text on the theory and interpretation of fluorescence phenomena.

Comprehensive text covering principles of fluorescence spectroscopy.

Manufacturer's statement of product conformity with relevant safety standards.

List of CE compliance tests and the standards they adhere to.