HP 4284A - Page 442

G
Transient States Caused by Measurement Condition
Changes
Introduction
The HP 4284A's internal circuit mayenter a transient state due to
changes in measurement conditions. In a transient state, the HP
4284A will not meet its sp ecications. So in this case, a delay time
(DELAY eld) must b e inserted into the measurement cycle until the
HP 4284A is no longer in a transient state. This app endix describ es
the measurement condition changes which cause the transient states,
and lists the delay times required for various transient states. (Refer
to Table G-1.)
Table G-1. Measurement Condition Changes
Change in
measurement
condition
DC BIAS: OFF DC BIAS: ON
DCI ISO: OFF DCI ISO: ON
Frequency 1
Meas. Range 2-(1)
1
2-(2)
1
2-(3)
1
DC Bias Voltage 3-(1)
1
3-(2)
1
Short-circuit
Recovery
4-(1) 4-(2)
1 Test Frequency f < 1kHz only
Transient States Caused by Measurement Condition Changes G-1