Konica Minolta cm-5 - Principles of Measurement; Illuminating;Viewing System

E166
Principles of Measurement
Illuminating/Viewing System
<Objective color reectance measurement>
This instrument utilizes the di:8°/de:8° geometry conforming to CIE No. 15, ASTM E1164, DIN 5033 Teil 7, ISO
7724/1 and JIS Z 8722-1982 (diffused illumination, 8-degree viewing angle) standards, and offers measurement
with automatic SCI (specular component included; total reectance) and SCE (specular component excluded;
diffuse reectance) switching.
The ow of measurement is shown below.
1. Illumination
Light from the xenon lamps
diffuses in the integrating
sphere and illuminates the
specimen uniformly.
2. Receiving
a : Light reected from the
specimen is received.
b : Light diffused in the
integrating sphere is
received.
3. Sensing
Light is received with the
specimen-measuring and
illumination-monitoring
optical systems.
The light in the wavelength
range of 360 to 740 nm is
divided into 10 nm pitch
components, and signals
proportional to the light
intensity of each component
are output to the analog
processing circuit.
1. Light from the pulsed xenon lamp diffuses on the inner surface of the integrating sphere and illuminates the
specimen uniformly.
2. a : The light reected from the specimen surface at an angle of 8° to the normal of the surface is received by
the specimen-measuring optical system.
b : The light diffused in the integrating sphere is received by the illumination-monitoring optical system and
guided to the sensor.
3. The light reected from the specimen surface and the diffused light are divided into each wavelength
component by the specimen-measuring optical system and illumination-monitoring optical sensor
respectively, and then signals proportional to the light intensity of each component are output to the analog
processing circuit.
By processing the outputs from the specimen-measuring optical system and the illumination-monitoring sensor
with the calculation by the CPU, the instrument compensates for slight uctuations in the spectral characteristics
and intensity of the illumination light. (Double-beam system)