MI 3102(H) BT EurotestXE Appendix C – Country notes
110
Appendix C – Country notes
This appendix C contains collection of minor modifications related to particular country
requirements. Some of the modifications mean modified listed function characteristics related to
main chapters and others are additional functions. Some minor modifications are related also to
different requirements of the same market that are covered by various suppliers.
C.1 List of country modifications
The following table contains current list of applied modifications.
C.2 AT modification – G type RCD
Modified is the following related to the mentioned in the chapter 5.5:
Added G type RCD,
Time limits are the same as for general type RCD,
Contact voltage is calculated the same as for general type RCD.
Modifications of the chapter 5.5:
Test parameters for RCD test and measurement
RCD sub-function test [Uc, RCDt, RCD I, AUTO]
Rated RCD residual current sensitivity I
N
[10 mA, 30 mA, 100 mA, 300 mA, 500
mA, 1000 mA].
RCD type [AC, A, F, B*, B+*].
starting polarity [ , , , , *
,
*].
Property selection [selective , general non-delayed , delayed , PRCD,
PRCD-K, PRCD-S, MI RCD*, EV RCD*].
Multiplication factor for test current [½, 1, 2, 5I
N
].
Conventional touch voltage limit [25 V, 50 V].
* Model MI 3102 BT only.
Note:
Selective (time delayed) RCDs and RCDs with (G) - time delayed characteristic
demonstrate delayed response characteristics. They contain residual current integrating
mechanism for generation of delayed trip out. However, contact voltage pre-test in the
measuring procedure also influences the RCD and it takes a period to recover into idle
state. Time delay of 30 s is inserted before performing trip-out test to recover type
RCD after pre-tests and time delay of 5 s is inserted for the same purpose for type
RCD.
To Next Page
Loading...
Need help?
General
