19 TEST FUNCTION
19.2 Device Test with Execution Conditions
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Data that can be set
The following tables list the data that can be set for the device test with execution conditions.
■Devices that can be set
*1 For bit devices, digit specification is allowed for K1 to K8 only.
*2 For word devices, bit specification is allowed.
*3 A local device, indirectly-specified device, or index-modified device can also be specified.
*4 The word devices of the other CPU modules, U3En\G and U3En\HG, can be specified in the engineering tool, however, the setting value
is not reflected in the CPU module. If U3En\G is specified, an error will occur.
The following devices cannot be used in redundant mode because they do not support the multiple CPU system.
• U3En\G to which other than the host CPU module is specified
•U3En\HG
■Labels that can be set
*1 Only labels that exist in the read project can be specified.
*2 Labels of a program block can be specified.
*3 Digit-specified labels cannot be specified.
*4 Bit specification is allowed.
*5 Specify the array element.
*6 Specify the structure member.
Type Device
*3
Bit device
*1
X, DX, Y, DY, M, L, F, SM, V, B, SB, T (contact), ST (contact), C (contact), LT (contact), LST (contact), LC (contact), FX, FY, Jn\X,
Jn\Y, Jn\SB, Jn\B
Word device
*2
T (current value), ST (current value), C (current value), D, SD, W, SW, RD, R, ZR, Z, FD, Un\G, Jn\W, Jn\SW, U3En\G
*4
, U3En\HG
*4
Double-word device LT (current value), LST (current value), LC (current value), LZ
Type
*1*2
Class Data type
Global label • VAR_GLOBAL
• VAR_GLOBAL_RETAIN
■Primitive data type
•Bit
*3
• Word (signed)
*4
• Double word (signed)
• Word (unsigned)
*4
• Double word (unsigned)
• Single-precision real number
• Double-precision real number
• Timer type
• Retentive timer type
• Counter type
• Long timer type
• Long retentive timer type
• Long counter type
■Array
*5
■Structure
*6
Local label • VAR
• VAR_RETAIN
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