Nokia 2650 - Test Points

Issue 2 06/2005 COMPANY CONFIDENTIAL 33
Copyright © 2005 Nokia. All Rights Reserved.
RH-53/54
8-System Module Nokia Customer Care
■ Test points
The following table show the test points on the main board.
Table 15: Test points
Test point: Description:
J100 Vbatt on battery connector
J101 BSI on battery connector
J102 GND on battery connector
J300 DAI_CLK on production test pattern
J150 GENIO 14 (Boomer)
J002 DLight
J303 Keyb1 (output from Hall IC)
J396 Test pattern (see
Figure 14)
J402 PURX (UPP)
J403 SLEEPX (UPP)
J404 SLEEPCLK (UPP)
J405 UEMINT (UPP)
J406 CBUSCLK (UPP)
J407 CBUSDA (UPP)
J408 CBUSENX (UPP)
J409 MBUSTX (UPP)
J410 MBUSRX (UPP)
J411 FBUSTX (UPP)
J412 FBUSRX (UPP)
J413 DBUSCLK (UPP)
J414 DBUSDA (UPP)
J415 DBUSEN1X (UPP)
J416 EXTWRX (UPP)
J417 EXTRDX (UPP)
J418 FLS2CSX (UPP)
J419 FLSCLK (UPP)
J420 FLSCSX (UPP)