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NXP Semiconductors PN7462AU - Rx Matrix XML Input File; Input Parameters

NXP Semiconductors PN7462AU
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NXP Semiconductors
UM10883
PN7462 family Quick Start Guide - Development Kit
UM10883
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2018. All rights reserved.
User manual
COMPANY PUBLIC
Rev. 1.614 May 2018
319816
42 of 120
Of course, the real smart card does not allow to vary the load modulation level, which
helps to find the optimum (sensitivity). So, an extended test setup as shown in Fig 42 can
be used to control the LMA voltage level. This setup contains
Reference PICC (ISO, EMVCo or NFC)
Keysight Arbitrary wave generator (AWG [13])
NFC Cockpit with PNEV7462B
Fig 42. Enhanced Rx Matrix Test setup with AWG
The input parameters for the test matrix run are defined in an XML file (see 6.10.3.1).
The test can be started in the NFC Cockpit (<Start RxMatrix>). The test result is stored
as table, when the test is finished. The table can be opened with e.g. Microsoft Excel for
interpretation (<View Output>).
6.10.3 Rx Matrix XML input file
The Rx Matrix Test requires the input configuration in an XML file. A few example XML
files (for type A, B, F, 15693 and I-Code ILT) are part of the NFC Cockpit package:
c:\nxp\NxpNfcCockpit_v<VERSION>\cfg\RxMatrix\RxMatrix_PN7462AU\
Refer also to 11 for one example for type A without AWG and one example for type B
with AWG.
Such an XML file defines all test parameters. The user can create (copy & paste) own
XML files, chose any from the existing XML files and then start the test.
6.10.3.1 Input parameters
Table 3. Test input
Parameter
Meaning
Example value
numberMaxOfPasses
How many trials per combination
10
skipAfterFailures
Continue with the next combination if more failures
occur than defined
4
delayMS
Additional delay between trials, if needed
0
fieldReset
Enable RF Reset, if needed (e.g. for type A card)
YES

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