11. About the Calibration Method for Wavelength Direction
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11. About the Calibration Method for
Wavelength Direction
11.1. General description of calibration
The calibration of the wavelength direction refers to the setting that is made to display the spectral
reflectance data measured with USPM in a correct position by means of a sample whose spectral
reflectance peak is known (measured with other calibrator, etc.). The calibration shifts, by 4 [nm],
the entire measured wavelengths toward the short wavelength side or long wavelength side of the
wavelength direction.
11.2. Calibration procedure
This subsection explains the calibration conducted by using the wavelength calibration sample
supplied standard with the software. The accessory calibration sample will be measured here.
Preparation
Put the calibration sample on the table. Bring the calibration sample to which a transparent glass
is bonded into focus. Operate the microscope in such a manner that the bonded reflecting mirror
face, not the transparent glass face, will be brought into focus.
False True
Measurement of background
Measure the background as in an ordinary measurement.
Measurement of reference
Measure the plane of the calibration sample to which a transparent glass is bonded as the
reflecting plane of the reference. If the data is found saturated when the reference is measured,
adjust the sampling time.
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