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General| Data Acquisition Rate | Up to 100 kHz |
|---|---|
| Maximum Sample Size | 100 mm diameter |
| Indenter Types | Berkovich, spherical, flat punch, custom |
| Techniques | DMA, scratch testing |
| Microscope Compatibility | Compatible with optical microscopes |
| Software | DMA |
Describes the Piuma Nanoindenter and its five main components.
Outlines the necessary cables and connection scheme for setting up the system.
Details powering up the instrument and launching the Piuma software.
Guides on selecting and installing the correct probe for measurements.
Describes the process of calibrating the optical signal for accurate measurements.
Explains how to determine the geometrical factor for accurate data analysis.
Manual positioning of the Piuma stages in X, Y, and Z directions.
Manual control of the piezo stack for precise indentation positioning.
Steps for safely approaching the sample surface using automated functions.
Overview of D-mode, P-mode, and I-mode operations.
Enables mechanical oscillations during indentation for dynamic analysis.
Instructions for setting up a dedicated folder and naming experiments.
Describes the process of conducting single or series of indentations.
Explains how load-displacement data is stored and processed.
Discusses minimizing errors from temperature drift and vibrations.
Addresses sample temperature, integrity, and mechanical instability.
Covers factors affecting probe stability like temperature and air bubbles.
Explains how the instrument uses optical probes and interferometry.
Describes methods to measure and calculate Young's modulus.
Overview of controls for operating stages, setting experiments, and viewing status.
Displays indentation results including modulus and probe suitability.
Menus to configure indentation profile, probe, and advanced settings.
Guides on navigating menus and using the interferometer's functions.
A flowchart to guide through calibration issues and solutions.
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