Philips 22RC026/00 - Functional Explanation (Continued); TES, HFL (Traverse signal); DRF (Beam level judgement); In-focus judgement

FUNCTIONAL EXPLANATION
8. TES, HFL (Traverse signal)
10.
PCS 82 441
In transferring pickup from inner track to outer track, EF
output from pickup should be so connected that HFL
and TES Nave phase relation as shown in the figure
below. TES comparator has about +100mvV hysteresis
at -polarity comparator against TESI input. To pickup
exclusively necessary signals out of TE signals, band
pass filter is configurated outside.
. DRF (Beam level judgement)
DRF becomes “H”, when EFM signal (RFSM output) is
held at peak value by condenser of PH1 (60pin) and
peak value of RFSM gets over 2.1V. Condenser of PH1
(60pin) is related to setting both DRF constant when
detected and RFAGC response.
—
ZEEE.
2:1
FE 7 \___________
\ ,
bal
Pickup
position | Pa
In focus
In-focus judgement
This detects DEF+0.2V of focus error signal S curve,
and then judges focus zero cross (being in focus) when
S curve becomes REF.
sinepone laos ‘REPO, 2V
5 i Ne a EM cad ene ra dit se =
re
In focus
11. DEFECT
This normally maintain mirror surface level by con-
denser of LF2 (59pin), and when lack of EFM signal
(RFSM output) gets over 0.35V, outputs “H” to DEF
(49pin). When DEF (49pin) becomes “H”, tracking
N.Y
LF2
(S9PIN)
a
sy
ania
Pw
ewveed rocco
= eee
DEF (49PIN) 7
12. Reset circuit
When Vcc gets over about 2.8V, Power on Reset is
cancelled.
22RC026