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Precision 660 - User Manual

Precision 660
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Precision 660 Specifications

General IconGeneral
BrandPrecision
Model660
CategoryTest Equipment
LanguageEnglish

Summary

Model 660 Tube Testing Features

Outstanding Tube Testing Features

Details 13 specific features of the Model 660 for comprehensive tube testing.

Key Tube Testing Capabilities

Highlights features like series string accommodation, cathode conductance, and open element tests.

Model 660 Instrument and Specialized Test Features

Instrument Features and Specifications

Covers pilot light tests, calibration accuracy, meter readability, wiring, and transformer isolation.

Specialized Testing Capabilities

Details features for testing transistors, crystal diodes, and picture tubes.

Transistor Testing Fundamentals

Understanding Transistor Parameters

Explains ICBO, Leakage (L), and Gain (G) tests for transistor evaluation.

Transistor Type and Environmental Considerations

Covers PNP/NPN, power/low-power transistors, and temperature sensitivity.

Picture Tube and Crystal Diode Testing

Picture Tube Beam Current Testing

Details testing picture tube beam current using the PTA adapter.

Crystal Diode Test Procedures

Covers forward and reverse current checks against manufacturer specifications.

Advanced Tube Testing Procedures

Special Tube Test Notes

Covers open element tests and specific procedures for "Eye" type indicator tubes.

Rectifier and Sub-Miniature Tube Testing

Rectifier Tube Testing Procedures

Outlines specific test procedures for rectifier tubes like 70A7, 117N7, and 117P7.

Sub-Miniature Tube Testing

Details testing sub-miniature tubes using the G-116 adapter.

Sub-Miniature Tube Adapter and Variations

Sub-Miniature Tube Adapter Application

Explains how to use the G-116 adapter for testing sub-miniature tubes.

Tube-Brand Variations

Covers managing changes in tube specifications and their impact on testing.

Operating Instructions for Transistor Tests

Low Power Transistor Testing Procedure

Step-by-step guide for testing low power transistors (Audio, RF, Computer).

Advanced Transistor Testing Techniques

Meter Sensitivity for Transistor Gain

Notes on adjusting meter sensitivity for accurate transistor gain readings.

Special Transistor Tests (IEBO;ICBS)

Introduces specific transistor tests like IEBO and ICBS.

Diode and Picture Tube Test Details

Crystal Diode Test Procedures

Details connections and lever settings for testing crystal diode polarity.

Picture Tube Beam Current Test Procedure

Provides steps for performing beam current tests on picture tubes.

Ballast Testing Procedures

Ballast Testing Capabilities

Outlines continuity, loose element, and leakage tests for ballasts.

Ballast Resistor Code and Interpretation

Explains the code system for identifying ballast types and wiring.

Service Data and Troubleshooting

Common Instrument Failures and Remedies

Lists common component failures and recommended repair measures.

Instrument Repair and Information

Covers instrument repair service, new tube test data subscriptions, and warranty.