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Rohde & Schwarz R&S SMW200A - Page 299

Rohde & Schwarz R&S SMW200A
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Configuring the Internal Baseband Source
R&S
®
SMW200A
299User Manual 1175.6632.02 ─ 30
In general, the I/Q samples are located on a deformed circle which is confined to
the dashed square in the upper diagrams.
"Rect" test signal: Rectangle signal with selectable but equal On and Off periods
and amplitude. The period is defined by the selected frequency: <Period> = 1 /
"Frequency".
The signal is mapped on both the I and Q samples. The mapping results in two dis-
tinct points in the I/Q plane. The "Offset DC" shifts both points along the diagonal
I(t) = Q(t).
"Const I/Q" test signal: Continuous test signal with constant IQ and constant
clock frequency of 10 kHz. The values for each I and Q components are selectable
but constant. They are defined as a decimal number, which is decimal-to-binary
converted internally. The signal is provided as a 16-bit wide digital signal for both I
and Q channels.
You can output the signal directly at the BNC connectors I and Q outputs of the
instrument.
"AWGN" test signal: Requires option R&S SMW-K811. Test signal comprising a
noise signal. The 3 dB noise bandwidth is about 0.96 times the clock frequency.
See also Chapter 5.8.4, "AWGN Test Signal", on page 349.
5.7.2.3 Waveform Sample Rate
The Arbitrary Waveform Generator includes a resampling unit that interpolates the
input samples to reach a target digital output I/Q sample rate. The input sample rate
Using the Arbitrary Waveform Generator (ARB)

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