Functional Test SME
1038.6002.02 4.6 E-13
TEST EPROM
➤
Tests the EPROM. The test result is displayed in a window.
TEST RAM
➤
Tests the RAM. The test result is displayed in a window.
RAM BATTERY Ð
Tests the RAM battery. The test result is displayed in a window.
TEST XMEM Ð
Tests the memory of option SME-B12 (8 MBit) without overwriting
the contents. The test result is displayed in a window.
Caution: The unit must not be switched off during the test run.
XMEM FILL PATTERN
Input value of the 8-bit pattern to fill the memory of option SME-B12.
This value is entered as a decimal equivalent (0-255). If the input
value = 256, the memory is continuously filled with the sequence
from 0 to 255.
FILL XMEM (DESTRUCTIVE!)Ð
Fills the complete memory of option SME-B12 with the 8-bit pattern
entered under XMEM FILL PATTERN.
Caution: Stored data will be overwritten.
GENERATE XMEM CHECKSUM Ð
Calculates the checksum of the active memory area of option
SME-B12. The active memory area is fixed by parameters START
ADDRESS, LENGTH and MEM MODE in the submenu CONFIG
XMEM... .
The checksum for the first line applies to the data in the MEM
MODE = 8M*1. The checksums for the second line (D/B/A) apply to
the DATA, BURST and LEV ATT memory in the MEM MODE =
1M*3.
XMEM BATTERY Ð
Tests the XMEM battery (Memory extension, option SME-B12). The
test result is displayed in a window.
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