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General| Brand | SIGLENT TECHNOLOGIES CO.,LTD |
|---|---|
| Model | SDM3045X |
| Category | Multimeter |
| Language | English |
Explains SCPI as an ASCII-based programming language for instruments.
Details the rules for command syntax, including braces, bars, and brackets.
Describes the use of colons and semicolons to separate commands and parameters.
Explains how MIN, MAX, and DEF can substitute specific parameter values.
Details how to use a question mark (?) to query current parameter values.
Outlines standard commands beginning with an asterisk for common functions like reset.
Describes different data formats for parameters: numeric, discrete, and boolean.
Aborts a measurement in progress, returning the instrument to the trigger idle state.
Waits for measurements to complete and copies them to the output buffer.
Sets the trigger state to "wait for trigger" and clears previous measurements.
Selects the slope (rising or falling) for the output signal on the BNC connector.
Reads and erases measurements from reading memory up to a specified count.
Reads and erases measurement results from storage up to a specified count.
Specifies the number of measurements (samples) taken per trigger.
Selects units (°C, °F, or Kelvin) for temperature measurements.
Configures calculation functions like limits, histograms, and averages.
Specifies measurements and indicates when a limit has been exceeded.
Configures the histogram display and data collection.
Scales ACV and DCV measurements, including dB and dBm functions.
Calculates measurement statistics such as mean, min, max, and standard deviation.
Provides the most concise way to configure measurement functions, range, and rate.
Allows configuration and removal of data from the instrument's reading memory.
Simplest way to program measurements, using default parameters and sending results directly.
Configures measurement functions like current, voltage, resistance, etc.
Configures system-level settings such as beep, IP address, and subnet mask.
Configures triggering parameters that control measurement acquisition.
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