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Toshiba GR200 Series - 14.4.3 Test for control application; (i) Synchronizing check test (SYNC01,02-Test); 14.4.4 Test for BI and BO circuits; (i) Binary input circuit test (SLOT*BIxx-SET)

Toshiba GR200 Series
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6F2S1914 (0.49)
GRL200 (Soft 033 & 037)
- 1512 -
14.4.3 Test for control application
(i) Synchronizing check test (SYNC01,02-Test)
Settings [SYNC01-Test] and [SYNC02-Test]=On allows to have test synchronized conditions.
See Chapter
Control and monitoring application: Synch check for difference network
.
14.4.4 Test for BI and BO circuits
(i) Binary input circuit test (SLOT*BIxx-SET)
Setting [SLOT*-BIxx-SET] allows to have a virtual input at a binary input circuit.
(ii) Binary output circuit test (SLOT*BOxx-SET)
Setting [SLOT*-BIxx-SET] allows to have a virtual output at a binary input circuit.
Note: For the BI and BO test operation, see Chapter
User interface: Test sub-menu
,
separately.
14.4.5 Test for mode change (MDCTRL)
The function is provided to detect a test mode. For more information, see Chapter
General
control function: Mode control function
, separately.
14.4.6 Signal monitor
The function is provided in order that the user can observe IED internal signals. For more
information, see Chapter
Technical description: Human machine interface: Monitoring jacks
,
separately.
14.4.7 LED light test
The user can perform LED lighting test by pressing the keys and . Press the both keys on
the front panel for a few seconds. If there is no problem, all LEDs will be lit.

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