Toshiba GR200 Series - (ii) DIFL operation at terminal-H

6F2S1914 (0.49)
GRL200 (Soft 033 & 037)
- 69 -
DIFL-STUB-Test†
On
8100001B66
&
&
To TRC‡
DS_OPEN
≥1
DIFL-TRIP_B
8000001B67
8100001B68
8200001B69
DIFL-TRIP_A
DIFL-TRIP_C
DIFL-STUB
On
DIFL#1
A
B
C
≥1
≥1
≥1
DIFL#2§
A
B
C
DIFL-STUB-COND
≥1
8300001B64
From PROT-COMM
Figure 2.6-11 STUB logic furnished in the local IED
†Note: For testing the stub protection, set On for scheme switch [DIFL-STUB-Test];
consequently, the user can examine the function regardless of the DS condition.
‡Note: The trip circuit (TRC) is discussed separately. See Chapter Relay application: Trip
circuit . Note that the trip signal generated opens the three-poles.
§Note: The DIFL#2 element is only available in the [TERM_TOPOLOGY]=2Term-Dual.
(ii) DIFL operation at terminal-H
On the other hand, the current data received from the opposite terminal is set to be zero when
the opposite terminal does not operate. That is, the IED_H gets to sense the operation of the
terminal G; the operation of the opposite can be sensed by using open terminal detection
function†. Consequently, the DIFL function does not need to have a respace for a fault such
that it is illustrated Figure 2.6-12.
CT2
G
CT1
G
Terminal-G
Fault
IED_G
IED_H
CT2
H
Terminal-H
Line GH
Line
DS
Line
Current
data
CB(Closed)
CB(Closed)
CB(Closed)
CB(Closed)
CB(Closed)
CB(Closed)
CT1
H
Figure 2.6-12 Fault occurred beyond Stub zone
†Note: On should be set for the [OTD] for the operation. For more information, see the
Chapter Relay application: Communication application .