VOLTECH AT3600 USER MANUAL PROGRAMMING TESTS
TEST PROGRAM EDITOR VPN 98 - 024 PAGE 3.4.1.
4. PROGRAMMING TESTS
This section describes in more detail how to fill in the data for the dialogue boxes for
each of the tests available for your AT3600.
By the end of this chapter you will be able to program any of the following tests :
Test Type Test Type
Continuity Trimming Adjustment
Resistance (dc) Output To User Port
Resistance (ac), series or parallel Insulation Resistance
Inductance, series or parallel Hi-Pot (DC)
Inductance with Internal Bias Hi-Pot (AC)
Quality Factor Surge (Impulse)
Dissipation factor Wattage
Leakage Inductance Wattage (External Source)
Inter-winding Capacitance Stress Wattage
Turns Ratio Stress Watts (External Source)
Turns Ratio By Inductance Magnetizing Current
Impedance Mag. Current (External Source)
Impedance with Internal Bias Voltage Open Circuit
Inductance Match Voltage O/C (External Source)
Capacitance Match Low Voltage Open Circuit
General Longitudinal Balance Leakage Current
Longitudinal Balance Inductance with External Bias
Insertion Loss Impedance with External Bias
Frequency Response Hi-Pot Ramp (AC)
Return Loss Hi-Pot Ramp (DC)
Impedance Phase Angle Voltage Break Down (AC)
Inter Winding Phase Angle Voltage Break Down (DC)
SEE ALSO:
Chapter 7 - ‘Test Conditions’ for help with selecting the tests and test signal
conditions that you need.
AND:
The tester’s measure mode can also be used to determine the nominal values of a new
part. See section 3.9 of this chapter.
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