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charles xieSep 1, 2026
why can't I download the whole user manual? I can only print this manual one page at a time. Can you help fix this so I can download the whole manual, all 104 pages?
why can't I download the whole user manual? I can only print this manual one page at a time. Can you help fix this so I can download the whole manual, all 104 pages?
Details free and charged service periods.
Lists exclusions from warranty coverage.
Outlines responsibilities for system use and modifications.
Shows external view of the UF200R system and identifies key components.
Explains location and operation of emergency stop and power switches.
Describes the display screen and its adjustment features.
Details the function and operation of the head stage for probe card attachment.
Describes the USB terminal for data backup and exchange.
Explains the optional internal printer and its feed function.
Details the cassette elevator and inspection tray operation.
Outlines the procedure from power-up to prober initialization.
Explains the Prober Status screen and its key buttons.
Covers creating, modifying, and switching device data files.
Details the procedure for replacing the probe card.
Describes the automatic and manual wafer alignment process.
Configuring parameters for probe-pad alignment.
Step-by-step guide for registering pads for alignment.
Explains the low and high magnification pad alignment process.
Details methods for determining contact height.
Procedures for verifying and adjusting probe marks.
Visual representation of the wafer mapping process flow.
Methods for defining the test area on the wafer.
Procedures for selecting and setting a reference die.
Assigning attributes (test, skip, mark) to individual dice.
Configuring settings for sampling dice during testing.
Changing parameters while lot processing is active.
Adjusting the probe tip overdrive amount during operation.
Verifying and correcting probe mark positions.
Viewing probe mark images on the screen.
Resets counters and map for retesting a wafer.
Functionality for re-probing a lot or specific dice.
Transferring wafers between cassettes and trays.
Performing manual tests via TTL interface.
Viewing data transmitted via GP-IB interface.
Managing wafer map data files (copy, delete, format).
Setting the prober's internal clock.
Managing the internal printer status and mode.
Executing cleaning cycles or resetting counters.
Checking the prober control program version.
Viewing total, pass, fail, and category counters.
Resetting counters for fail check and yield.
Checking internal prober program data.
Checking and resetting marker counters.
Hiding or showing parameters on menu screens.
Creating user files by selecting Basic Operation parameters.
Initializing and restarting the prober system.
General| Brand | ACCRETECH |
|---|---|
| Model | UF200R |
| Category | Measuring Instruments |
| Language | English |