Agilent Technologies EasyEXPERT - Page 14

WGFMU
(needs test
definitions of
WGFMU
Utility)
Fast BTI(ACstress
Id-Sampling)
B1500A WGFMU 1, RSU 2
Fast BTI(DCstress
Id-Sampling)
B1500A WGFMU 1, RSU 2
Fast BTI(ACstress Id-Vg) B1500A WGFMU 1, RSU 2
Fast BTI(DCstress Id-Vg) B1500A WGFMU 1, RSU 2
TRANSIV DC IdVd B1500A SMU 2, WGFMU 1, RSU 2
TRANSIV DC IdVg B1500A SMU 2, WGFMU 1, RSU 2
WGFMU Pattern Editor B1500A WGFMU 1, RSU 2
WGFMU
Utility
(cannot be
executed
directly)
Fast BTI Id-Sampling child B1500A WGFMU 1, RSU 2
Fast BTI Id-Sampling child2 B1500A WGFMU 1, RSU 2
Fast BTI Id-Vg child B1500A WGFMU 1, RSU 2
Fast BTI Id-Vg child2 B1500A WGFMU 1, RSU 2
Fast BTI Pattern Editor Child
DataDisplay
B1500A WGFMU 1, RSU 2
WGFMU_IV WGFMU DCIV B1500A WGFMU 1, RSU 2
WGFMU PLSDIV B1500A WGFMU 1, RSU 2
WGFMU Id-Vd (DC) B1500A WGFMU 1, RSU 2
WGFMU Id-Vg (DC) B1500A WGFMU 1, RSU 2
WGFMU Id-Vd pulse B1500A WGFMU 1, RSU 2
WGFMU Id-Vg pulse B1500A WGFMU 1, RSU 2
GaN Diode Diode Current Collapse IV-t
Sampling
B1505A N1267A 1, HVSMU 1, HCSMU 1,
MCSMU 1
Diode Current Collapse
Signal Monitor
B1505A N1267A 1, HVSMU 1, HCSMU 1,
MCSMU 1
GaN FET FET Current Collapse IV-t
Sampling (I Force)
B1505A N1267A 1, HVSMU 1, HCSMU 1,
MCSMU 2, SMU 1
FET Current Collapse IV-t
Sampling
B1505A N1267A 1, HVSMU 1, HCSMU 1,
MCSMU 2, SMU 1
FET Current Collapse Signal
Monitor (I Force)
B1505A N1267A 1, HVSMU 1, HCSMU 1,
MCSMU 2, SMU 1
FET Current Collapse Signal
Monitor
B1505A N1267A 1, HVSMU 1, HCSMU 1,
MCSMU 2, SMU 1
Id-Vds Current Collapse B1505A N1267A 1, HVSMU 1, HCSMU 1,
MCSMU 2, SMU 1
IGBT Cce B1505A MFCMU 1, HVSMU 1, Bias-T 1
Cgc B1505A MFCMU 1, HVSMU 1, Bias-T 1
Cge B1505A MFCMU 1, Bias-T 1 or N1259A with 020
Cge-Vge B1505A MFCMU 1
Category Test definition name Supported analyzer Required equipment and quantity