11 Reliability
[Test Output: List Display]
TimeList: Accumulated stress time
Dev1_IcList: Collector current for device 1
Dev2_IcList: Collector current for device 2
Dev3_IcList: Collector current for device 3
Dev1_hfe@IcList: Y3 accumulation data at Icollector=Ic@hfe for device 1
Dev2_hfe@IcList: Y3 accumulation data at Icollector=Ic@hfe for device 2
Dev3_hfe@IcList: Y3 accumulation data at Icollector=Ic@hfe for device 3
Dev1_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 1
Dev2_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 2
Dev3_Ib@IcList: Y1 accumulation data at Icollector=Ic@hfe for device 3
Agilent EasyEXPERT Application Library Reference, Edition 8
11-8
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