11 Reliability
[Extended Test Parameters for IvSweep_hfe]
HoldTime: Hold time
DelayTime: Delay time
IsubsLimit: Substrate current compliance
BaseMinRng: Minimum range for base current measurement
CollectorMinRng: Minimum range for collector current measurement
Ve: Emitter voltage
Vsubs: Substrate voltage
hfe_Min: Minimum hfe value for graph scale
hfe_Max: Maximum hfe value for graph scale
[User Function]
[User Function for Sampling_Stress]
Maximum elapsed time value MaxTime=max(Time)
Stress time StressTime=AccTime+Time
[User Function for IvSweep_hfe]
Current amplification factor hfe=Icollector/Ibase
[Analysis Function]
[Analysis Function for IvSweep_hfe]
Ib@Ic=@L1X (X intercept of Line1)
hfe@Ic=@L2Y3 (X intercept of Line2)
[Auto Analysis]
[Auto Analysis for IvSweep_hfe]
Line1: Horizontal line for Y1 at Icollector=Ic@hfe
Line2: Horizontal line for Y3 at Icollector=Ic@hfe
[Test Output: X-Y Graph]
X axis: Accumulated stress time TimeList (LOG)
Y1 axis: Collector current IcList (LOG)
Y2 axis: Y1 accumulation data at Icollector=Ic@hfe Ib@IcList (LOG)
Y3 axis: Y3 accumulation data at Icollector=Ic@hfe Ihfe@IcList (LINEAR)
[Test Output: List Display]
Accumulated stresss time TimeList
Collector current IcList
Y1 accumulation data at Icollector=Ic@hfe Ib@IcList
Y3 accumulation data at Icollector=Ic@hfe hfe@IcList
Agilent EasyEXPERT Application Library Reference, Edition 8
11-10
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