11 Reliability
[Extended Test Parameters for Sampling_Ids]
Vs: Source terminal voltage, constant voltage
IgLimit: Gate current compliance
IdLimit: Drain current compliance
DrainMinRng1: Minimum range for drain current measurement on device 1
DrainMinRng2: Minimum range for drain current measurement on device 1
DrainMinRng3: Minimum range for drain current measurement on device 1
[User Function]
[User Function for Sampling_Stress]
Maximum elapsed time value MaxTime=max(Time)
Stress time StressTime=AccTime+Time
[User Function for IvSweep_ConstId]
Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only)
[User Function for IvSweep_gmmax]
Transconductance gm=diff(Idrain,Vgate)
Maximum transconductance value gmmax=max(gm)
Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only)
[Analysis Function]
[Analysis Function for IvSweep_ConstId]
Vth@Id=@L1X (X intercept of Line1)
[Analysis Function for IvSweep_gmmax]
Vth@Gm=@L1X (X intercept of Line1)
[Auto Analysis]
[Auto Analysis for IvSweep_ConstId]
Line1: Vertical line for Y1 at Idrain=Id@Vth
[Auto Analysis for IvSweep_gmmax]
Line1: Tangent line for Y1 at gm=gmMax
[Test Output: X-Y Graph]
X axis: Elapsed time TimeList (LOG)
Y1 axis: Drain current for device 1 Dev1_IdsList (LOG)
Y2 axis: Drain current for device 2 Dev2_IdsList (LOG)
Y3 axis: Drain current for device 3 Dev3_IdsList (LOG)
Y4 axis: Maximum transconductance value for device 1 Dev1_GmMaxList (LINEAR)
Y5 axis: Maximum transconductance value for device 2 Dev2_GmMaxList (LINEAR)
Y6 axis: Maximum transconductance value for device 3 Dev3_GmMaxList (LINEAR)
[Test Output: List Display]
TimeList: Elapsed time
Dev1_IdsList: Drain current for device 1
Dev2_IdsList: Drain current for device 2
Dev3_IdsList: Drain current for device 3
Dev1_VthIdList: Vth for device 1, determined by constant current method
Dev2_VthIdList: Vth for device 2, determined by constant current method
Dev3_VthIdList: Vth for device 3, determined by constant current method
Dev1_VthGmList: Vth for device 1, determined by extrapolation method
Dev2_VthGmList: Vth for device 2, determined by extrapolation method
Dev3_VthGmList: Vth for device 3, determined by extrapolation method
Dev1_GmMaxList: Maximum transconductance value for device 1
Dev2_GmMaxList: Maximum transconductance value for device 2
Dev3_GmMaxList: Maximum transconductance value for device 3
Agilent EasyEXPERT Application Library Reference, Edition 8
11-21