11 Reliability
[Analysis Function for IvSweep_gmmax]
Vth@Gm=@L1X (X intercept of Line1)
[Auto Analysis]
[Auto Analysis for IvSweep_ConstId]
Line1: Vertical line for Y1 at Idrain=Id@Vth
[Auto Analysis for IvSweep_gmmax]
Line1: Tangent line for Y1 at gm=gmMax
[X-Y Graph]
[X-Y Graph for Sampling_Stress]
X axis: Stress time StressTime (LINEAR)
Y1 axis: Gate current Igate (LOG)
[X-Y Graph for IvSweep_ConstId]
X axis: Gate voltage Vgate (LINEAR)
Y1 axis: Drain current Idrain (LINEAR)
Y2 axis: Drain current Idrain (LOG)
[X-Y Graph for IvSweep_gmmax]
X axis: Gate voltage Vgate (LINEAR)
Y1 axis: Drain current Idrain (LINEAR)
Y2 axis: Transconductance gm (LINEAR)
[X-Y Graph for Sampling_Ids]
X axis: Elapsed time Time (LINEAR)
Y1 axis: Drain current Idrain (LOG)
[List Display]
[List Display for Sampling_Stress]
Stress time StressTime
Elapsed time Time
Gate voltage Vgate
Drain voltage Vdrain
Gate current Igate
[List Display for IvSweep_ConstId]
Gate voltage Vgate
Drain voltage Vdrain
Drain current Idrain
[List Display for IvSweep_gmmax]
Gate voltage Vgate
Drain voltage Vdrain
Drain current Idrain
Transconductance gm
[List Display for Sampling_Ids]
Elapsed time Time
Drain current Idrain
[Test Output: X-Y Graph]
X axis: Elapsed time TimeList (LOG)
Y1 axis: Maximum transconductance value gmMaxList (LINEAR)
Agilent EasyEXPERT Application Library Reference, Edition 8
11-37
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