Agilent Technologies EasyEXPERT - Page 33

1 BJT
1.12 Cts: Cts-Vsc characteristics (A.01.20)
[Supported Analyzer]
B1500A
[Description]
Measures the Collector-Substrate capacitance (Cts), and plots the Cts-Vsc characteristics.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Device Under Test]
Bipolar transistor
Connect Collector to the CMU Low, Substrate to the CMU High, and the other terminals to the GNDU.
[Device Parameters]
Polarity: NPN (CMU forces the specified value) or PNP (CMU forces the negative specified value).
Le: Emitter length
We: Emitter width
Lc: Collector length
Wc: Collector width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
FREQ: Measurement frequency
OscLevel: Measurement signal level
Subs: CMU connected between Collector and Substrate (CV sweep measurement)
VscStart: DC bias start voltage
VscStop: DC bias stop voltage
VscStep: DC bias step voltage
[Extended Test Parameters]
HoldTime: Hold time
DelayTime: Delay time
[Measurement Parameters]
Parallel capacitance Cp
Conductance G
[User Function]
PI=3.141592653589
D=G/(2*PI*FREQ*Cp)
Rp=1/G
Cs=(1+D^2)*Cp
X=-1/(2*PI*FREQ*Cs)
Rs=D*abs(X)
Z=sqrt(Rs^2+X^2)
Agilent EasyEXPERT Application Library Reference, Edition 8
1-17