11 Reliability
Port3 current Iport3
Port4 current Iport4
[User Function]
Voltage between terminals of wiring device DeltaV=Vm1-Vm2
Resistance of wiring device R=Vport1/Iport2
[X-Y Graph]
X axis: Stress time Time (LOG)
Y1 axis: Resistance of wiring device R (LINEAR)
Y2 axis: Voltage between terminals of wiring device DeltaV (LINEAR)
Y3 axis: Port3 current Iport3 (LOG)
Y4 axis: Port4 current Iport4 (LOG)
[List Display]
Stress time Time
Resistance of wiring device R
Voltage between terminals of wiring device DeltaV
Port2 current Iport2
Port3 current Iport3
Port4 current Iport4
[Test Output: X-Y Graph]
X axis: Accumulated stress time TimeList (LOG)
Y1 axis: Resistance of wiring device RList (LINEAR)
Y2 axis: Difference from initial resistance DeltaRList (LINEAR)
Y3 axis: Port2 current Iport2List (LOG)
Y4 axis: Port3 current Iport3List (LOG)
Y5 axis: Port4 current Iport4List (LOG)
[Test Output: List Display]
Accumulated stress time TimeList
Resistance of wiring device RList
Difference from initial resistance DeltaRList
Port2 current Iport2List
Port3 current Iport3List
Port4 current Iport4List
[Test Output: Parameters]
Time to failure given by rate of resistance change R_FailureTime
Time to failure given by monitoring extrusion lines E_FailureTime
Agilent EasyEXPERT Application Library Reference, Edition 8
11-51
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