Agilent Technologies EasyEXPERT - Page 354

11 Reliability
[Test Parameters for Sampling_Ids]
Vg3: Gate terminal voltage
Vd3: Drain terminal voltage
IdsStopRate: Ids change rate to stop testing
[Extended Test Parameters]
StoringRuntimeData: Data save during stress output, Yes or No
[Extended Test Parameters for IvSweep_ConstId]
HoldTime: Hold time
DelayTime: Delay time
Vs: Source terminal voltage
Vsubs: Substrate terminal voltage
IgLimit: Gate current compliance
IsubsLimit: Substrate current compliance
DrainMinRng: Minimum range for drain current measurement
[Extended Test Parameters for IvSweep_gmmax]
HoldTime: Hold time
DelayTime: Delay time
Vs: Source terminal voltage
Vsubs: Substrate terminal voltage
IgLimit: Gate current compliance
IsubsLimit: Substrate current compliance
Vth_Min: Minimum Vth value for graph scale
Vth_Max: Maximum Vth value for graph scale
gmMax_Min: Minimum gmMax value for graph scale
gmMax_Max: Maximum gmMax value for graph scale
DrainMinRng: Minimum range for drain current measurement
[Extended Test Parameters for Sampling_Ids]
Vs: Source terminal voltage
Vsubs: Substrate terminal voltage
IgLimit: Gate current compliance
IsubsLimit: Substrate current compliance
DrainMinRng: Minimum range for drain current measurement
[Measurement Parameters]
[Measurement Parameters by Sampling_Stress]
Drain current Idrain
[Measurement Parameters by IvSweep_ConstId]
Drain current Idrain
[Measurement Parameters by IvSweep_gmmax]
Drain current Idrain
[Measurement Parameters by IvSweep_Ids]
Drain current Idrain
[User Function]
[User Function for IvSweep_ConstId]
Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only)
Agilent EasyEXPERT Application Library Reference, Edition 8
11-70