Agilent Technologies EasyEXPERT - Page 364

11 Reliability
[Test Output: List Display]
Stress time TimeList
Port1 terminal voltage Vport1List
[Test Output: Parameters]
Breakdown voltage Vbd
Time to breakdown Tbd
Charge to breakdown Qbd
[Qbd calculation]
Qbd=I1Stress*Tbd/L/W
Agilent EasyEXPERT Application Library Reference, Edition 8
11-80