11 Reliability
Qbd2val=integ(Iport2,Time)/L/W
Qbd3val=integ(Iport3,Time)/L/W
[X-Y Graph]
X axis: Stress time Time (LOG)
Y1 axis: Port1 current Iport1 (LOG)
Y2 axis: Port2 current Iport2 (LOG)
Y3 axis: Port3 current Iport3 (LOG)
Y4 axis: Port4 current Iport4 (LOG)
[List Display]
Stress time Time
Port1 current Iport1
Port2 current Iport2
Port3 current Iport3
Port4 current Iport4
Port1 voltage Vport1
Port2 voltage Vport2
Port3 voltage Vport3
Port4 voltage Vport4
[Test Output: X-Y Graph]
X axis: Stress time TimeList (LOG)
Y1 axis: Port1 current Iport1List (LOG)
Y2 axis: Port2 current Iport2List (LOG)
Y3 axis: Port3 current Iport3List (LOG)
[Test Output: List Display]
Stress time TimeList
Port1 current Iport1List
Port2 current Iport2List
Port3 current Iport3List
Device1 charge to breakdown Qbd1List
Device2 charge to breakdown Qbd2List
Device3 charge to breakdown Qbd3List
[Test Output: Parameters]
Device1 time to breakdown Tbd1
Device2 time to breakdown Tbd2
Device3 time to breakdown Tbd3
Device1 charge to breakdown Qbd1
Device2 charge to breakdown Qbd2
Device3 charge to breakdown Qbd3
Agilent EasyEXPERT Application Library Reference, Edition 8
11-84
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