Agilent Technologies EasyEXPERT

15 Structure
1. BVgb ThinOx: MOS capacitor Ig-Vg characteristics (A.01.20)
2. BVgb: MOS capacitor Gate-Substrate breakdown voltage (A.01.20)
3. Cgb-Freq[2] Log: Cgb-f characteristics, 2 terminals (A.01.20)
4. Cgb-Vg 2Freq: MOS capacitor Cgb-Vg characteristics, 2-frequency method (A.01.11)
5. Cgb-Vg[2]: MOS capacitor Cgb-Vg characteristics (A.01.11)
6. Cj-Freq Log: Cj-f characteristics, junction device (A.01.20)
7. Cj-V: Junction capacitance Cj-V characteristics (A.01.11)
8. Diode BVAndCj-V ASU: Diode junction capacitance and breakdown voltage measurement using ASUs
(A.01.20)
9. Diode BVAndCj-V SCUU: Diode junction capacitance and breakdown voltage measurement using SCUU
(A.01.20)
10. Ig-Vg Iforce: MOS capacitor Ig-Vg characteristics, current sweep (A.01.20)
11. Ig-Vg Vforce: MOS capacitor Ig-Vg characteristics, voltage sweep (A.01.20)
12. Interconnect CouplingCap: Interconnection capacitance (A.01.11)
13. Interconnect OverlapCap: Layer to layer film capacitance (A.01.11)
14. Junction BV: Junction device breakdown voltage (A.01.20)
15. Junction DcParam: Junction device DC parameters (Is,N,Rs) (A.01.20)
16. Junction IV Fwd: Diode forward bias characteristics (A.01.20)
17. Junction IV Rev: Diode reverse bias characteristics (A.01.20)
18. QSCV[2] C-Vg, Ig-Vg (2-terminal) (A.03.00)
19. QSCV C Offset Meas Offset capacitance measurement
20. Rdiff-I kelvin: Diffusion resistor R-I characteristics, Kelvin connection (A.01.11)
21. Rdiff-I: Diffusion resistor R-I characteristics (A.01.11)
22. Rdiff-V kelvin: Diffusion resistor R-V characteristics, Kelvin connection (A.01.20)
23. Rdiff-V: Diffusion resistor R-V characteristics (A.01.20)
24. R-I DVM: Low resistance measurement using 3458A, current force (A.01.20)
25. R-I kelvin: Resistor R-I characteristics, Kelvin connection (A.01.11)
26. R-I: Resistor R-I characteristics (A.01.11)
27. R-V DVM: Low resistance measurement using 3458A, voltage force (A.01.20)
28. R-V kelvin: Resistor R-V characteristics, Kelvin connection (A.01.20)
29. R-V: Resistor R-V characteristics (A.01.20)
30. VanDerPauw Square: Van Der Pauw pattern sheet resistance (A.01.11)
Agilent EasyEXPERT Application Library Reference, Edition 8
15-2