15 Structure
15.5 Cgb-Vg[2]: MOS capacitor Cgb-Vg characteristics (A.01.11)
[Supported Analyzer]
B1500A
[Description]
Measures the Gate-Substrate capacitance (Cgb), and plots the Cgb-Vg characteristics.
DC bias output is performed from -VgbStart to -VgbStop in -VgbStep steps.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Device Under Test]
MOS capacitor
Connect Gate to the CMU Low, and Substrate to the CMU High.
[Device Parameters]
Polarity: Nch (CMU forces the specified value) or Pch (CMU forces the negative specified value).
Lg: Gate length
Wg: Gate width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
FREQ: Measurement frequency
OscLevel: Measurement signal level
Gate: CMU connected between Gate and channel (CV sweep measurement)
VgbStart: DC bias start voltage
VgbStop: DC bias stop voltage
VgbStep: DC bias step voltage
[Extended Test Parameters]
HoldTime: Hold time
DelayTime: Delay time
[Measurement Parameters]
Parallel capacitance Cp
Conductance G
[User Function]
PI=3.141592653589
D=G/(2*PI*FREQ*Cp)
Rp=1/G
Cs=(1+D^2)*Cp
X=-1/(2*PI*FREQ*Cs)
Rs=D*abs(X)
Z=sqrt(Rs^2+X^2)
Theta=atan(X/Rs)
Agilent EasyEXPERT Application Library Reference, Edition 8
15-10
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