Agilent Technologies EasyEXPERT

18 WGFMU
VgMeas: Gate voltage for Id measurement
VdMeas: Drain voltage for Id measurement
MeasDelay: Delay time until the measurement is started after the transition to the measurement voltage is
started
MeasInterval: Sampling interval (for Id measurement)
MeasPoints: Number of the Id measurement points
IntegTime: Integration time for one measurement point
TransEdge: Voltage change time between the stress voltage and the measurement voltage, for both Gate and
Drain terminals
SeqDelay: Device delay time
Lin_Log: Linear (linear sampling), Log10 (10 points/decade log sampling), or Log25 (25 points/decade log
sampling)
PointToPlot: Data index to specify the Id measurement data used for result data plot
Device delay time must be set to avoid that the high voltage is applied to the drain and gate terminals
simultaneously at the transition between stress and measurement. The value depends on the device under test,
TransEdge value, and such.
PointToPlot must be 1 to MeasPoints. PointToPlot=1 specifies the first measurement data.
[Device_ID_Setup]
Device_ID_Override: Y (sets the New_Device_ID value to the Device ID) or N (does not set)
New_Device_ID: Device ID
[Pattern_Validate_Setup]
PatternValidateFile: Absolute path name of the file for checking WGFMU output waveform.
[Extended Test Parameters]
VgForceRange: Gate voltage output range
VdForceRange: Drain voltage output range
[Test Output: X-Y Graph]
Id-AccumlatedStressTime: Drain current vs Accumulated stress time characteristics
Agilent EasyEXPERT Application Library Reference, Edition 8
18-4