27 PowerMOSFET, PMIC, SiC
[Test Output: X-Y Graph]
X axis: Stress time TimeList (LOG)
Y axis: Stress current IStressList (LOG)
[Test Output: List Display]
Stress time TimeList
Stress current IStressList
Charge for device failure QbdList
[Parameter Display Area]
Device failure time Timebd
Device failure charge Qbd
Temperature Ta=Temp
Agilent EasyEXPERT Application Library Reference, Edition 8
27-20
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