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Agilent Technologies EasyEXPERT

Agilent Technologies EasyEXPERT
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2 CMOS
1. BVdss: Breakdown voltage between source and drain (A.01.20)
2. BVgso: Breakdown voltage between gate and source (A.01.20)
3. Cgb-AC Level: Cgb-Vosc characteristics (A.01.11)
4. Cgb-Freq Log: Cgb-f characteristics (A.01.20)
5. Cgb-Vg HighVoltage: Cgb-Vg characteristics using SCUU (A.01.11)
6. Cgb-Vg: Cgb-Vg characteristics (A.01.11)
7. Cgc-Freq Log: Cgc-f characteristics (A.01.20)
8. Cgc-Vg: Cgc-Vg characteristics (A.01.11)
9. Cgg-Freq Linear: Cgg-f characteristics (A.01.20)
10. Cgg-Freq Log: Cgg-f characteristics (A.01.20)
11. Cgg-Vg 2Freq: Cgg-Vg characteristics, 2-frequency method (A.01.11)
12. Cgg-Vg: Cgg-Vg characteristics (A.01.11)
13. IdRdsGds: Drain resistance/conductance (A.01.20)
14. Id-Vd pulse: Id-Vd characteristics, SMU Pulse (A.01.11)
15. Id-Vd pulse[3]: Id-Vd characteristics (3-terminal), SMU Pulse (A.01.11)
16. Id-Vd: Id-Vd Characteristics (A.01.20)
17. Id-Vd[3]: Id-Vd Characteristics (3-terminal) (A.01.20)
18. Id-Vg pulse: Id-Vg characteristics, SMU Pulse (A.01.12)
19. Id-Vg Vpulse[3]: Id-Vg characteristics (3-terminal), SMU Pulse (A.01.11)
20. Id-Vg: Id-Vg Characteristics (A.01.20)
21. Id-Vg[3]: Id-Vg Characteristics (3-terminal) (A.01.20)
22. IonIoffSlope: On current, off current, and subthreshold slope (A.01.20)
23. Isub-Vg: Isub-Lg characteristics (A.01.20)
24. QSCV[4]: C-Vg, Ig-Vg (4-terminal) (A.03.00)
25. QSCV C Offset Meas: Offset capacitance measurement
26. Simple Cgb: Evaluation of gate-substrate capacitance versus gate voltage (A.01.10)
27. Simple Vth: Evaluation of Threshold Voltage (Vth) (A.01.20)
28. Vth Const Id: Constant current Vth (A.01.20)
29. Vth gmMax: Linear region Vth (A.01.20)
30. VthAndCgg-Vg ASU: Cgg-Vg, Id-Vg, using ASU (A.01.20)
31. VthAndCgg-Vg SCUU: Cgg-Vg, Id-Vg, using SCUU (A.01.20)
32. Vth-Lg: Vth-Lg characteristics (A.01.20)
33. Vth-Wg: Vth-Wg characteristics (A.01.20)
Agilent EasyEXPERT Application Library Reference, Edition 8
2-2

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