2 CMOS
2.12 Cgg-Vg: Cgg-Vg characteristics (A.01.11)
[Supported Analyzer]
B1500A
[Description]
Measures the Gate capacitance (Cgg), and plots the Cgg-Vg characteristics.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Device Under Test]
MOSFET, 4 terminals
Connect Gate to the CMU Low, and the other terminals to the CMU High.
[Device Parameters]
Polarity: Nch (CMU forces the specified value) or Pch (CMU forces the negative specified value).
Lg: Gate length
Wg: Gate width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
FREQ: Measurement frequency
OscLevel: Measurement signal level
Gate: CMU connected to Gate terminal (CV sweep measurement)
VgsStart: DC bias start voltage
VgsStop: DC bias stop voltage
VgsStep: DC bias step voltage
[Extended Test Parameters]
HoldTime: Hold time
DelayTime: Delay time
[Measurement Parameters]
Parallel capacitance Cp
Conductance G
[User Function]
PI=3.141592653589
Dval=Gval/(2*PI*FREQ*Cpval)
Rpval=1/Gval
Csval=(1+Dval^2)*Cpval
Xval=-1/(2*PI*FREQ*Csval)
Rsval=Dval*abs(Xval)
Zval=sqrt(Rsval^2+Xval^2)
Thetaval=atan(Xval/Rsval)
Vgateval=-Vsubs
Agilent EasyEXPERT Application Library Reference, Edition 8
2-24
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