Cisco ONS 15454 SDH - Hairpin Circuits; Cross-Connect Loopbacks

15-8
Cisco ONS 15454 SDH Reference Manual, R4.6
April 2008
Chapter 15 Performance Monitoring
15.4.2 E3-12 Card Performance Monitoring Parameters
Table 15-5 Line PM Parameters for the Near-End E3-12 Card
Parameter Definition
E3 CV-L Code Violation Line (CV-L) indicates that the number of coding
violations occurring on the line. This parameter is a count of BPVs and
EXZs occurring over the accumulation period.
E3 ES-L Errored Seconds Line (ES-L) is a count of the seconds containing one or
more anomalies (BPV + EXZ) and/or defects (loss of signal) on the line.
E3 SES-L Severely Errored Seconds Line (SES-L) is a count of the seconds
containing more than a particular quantity of anomalies (BPV + EXZ >
44) and/or defects on the line.
E3 LOSS-L Line Loss of Signal (LOSS-L) is a count of one-second intervals
containing one or more LOS defects.
Table 15-6 Path PM Parameters for the Near-End E3-12 Card
Parameter Definition
E3 P-ES Path Errored Second (P-ES) is a one-second period with at least one
defect.
E3 P-SES Path Severely Errored Seconds (P-SES) is a one-second period containing
at least one defect. SES is a subset of ES.
E3 P-UAS Path Unavailable Seconds (P-UAS) is a count of the seconds when the
path was unavailable. A path becomes unavailable when ten consecutive
seconds occur that qualify as P-SESs, and it continues to be unavailable
until ten consecutive seconds occur that do not qualify as P-SESs.
E3 P-ESR Path Errored Second Ratio (P-ESR) is the ratio of errored seconds to total
seconds in available time during a fixed measurement interval.
E3 P-SESR Path Severely Errored Second Ratio (P-SESR) is the ratio of SES to total
seconds in available time during a fixed measurement interval.
Table 15-7 VC3 Low-Order Path PM Parameters for the Near-End and Far-End E3-12 Card
Parameter Definition
LP-EB Low-Order Path Errored Block (LP-EB) indicates that one or more bits
are in error within a block.
LP-BBE Low-Order Path Background Block Error (LP-BBE) is an errored block
not occurring as part of an SES.
LP-ES Low-Order Path Errored Second (LP-ES) is a one-second period with one
or more errored blocks or at least one defect.
LP-SES Low-Order Path Severely Errored Seconds (LP-SES) is a one-second
period containing 30 percent or more errored blocks or at least one defect.
SES is a subset of ES.