dehn PM 20 - Page 52

Test scheme for modules ...; in the PA DRL test adapter, DPL 1 slot
Testprogramme Pin at +/- Remark
XXXXXX 1
1 Þ E Test both polarities
XXXXXX 2 2 Þ E Test both polarities
XX X 3 1 Þ 2 Test both polarities
XXXXXX 4 1 Þ 2 Pin 3 and 4 short-circuited internally
Upper slot Upper slot without EF 10 DRL earthing frame
Lower slot X X X X X X Lower slot
Test circuit X X X X X X According to contacting
Test circuit 1 to 10
DPL 1 G A...
DPL 1 F ALE...
DPL 1 F ARE...
DPL 1 F ALD...
DPL 1 F ATP...
DPL 1 F ARD...
DPL 1...
Type Part No.
Test programme
1 (1 Þ E)
DPL 1F ALE 5 907 120 5 10 5 10 - - 0 1
DPL 1F ALE 12 907 121 15 21 15 21 - - 0 1
DPL 1F ALE 15 907 122 20 28 20 28 - - 0 1
DPL 1F ALE 24 907 123 31 41 31 41 - - 0 1
DPL 1F ALE 48 907 124 99 141 99 141 - - 0 1
DPL 1F ALE 60 907 125 99 141 99 141 - - 0 1
DPL 1F ALE 110 907 126 182 229 182 229 - - 0 1
DPL 1F ARE 5 907 127 5 10 5 10 - - 0 1
DPL 1F ARE 12 907 128 15 21 15 21 - - 0 1
DPL 1F ARE 15 907 129 20 28 20 28 - - 0 1
DPL 1F ARE 24 907 130 31 41 31 41 - - 0 1
DPL 1F ALD 110 907 143 178 283 178 283 183 229 0 1
DPL 1F ATP 5 907 144 178 283 178 283 8 13 0 1
DPL 1F ARD 110 907 145 178 283 178 283 183 229 0 1
DPL 1F ARD 250 907 146 277 424 277 424 277 353 0 1
DPL 1G A 110 907 220 182 279 182 279 - - - -
Test programme
2 (2 Þ E)
Test programme
3 (1 Þ 2)
Test programme
4 (1 Þ 2, 3-4)
Pin assignment
upper slot DPL 10, DRL
Pin assignment lower slot DPL 1
Page
20
LLV
in [ V ]
ULV
in [ V ]
ULV
in [ V ]
LLV
in [ V ]
ULV
in [ V ]
LLV
in [ V ]
Tests have to be carried out with both polarities+/- and -/+!
Prüfung
Test Pin
1: 1 E
2: 2 E
3: 1 2
4: 1 / 3
2 / 4
(bei: + / -)
(at: + / -)
Polarität
Polarity
+ / -
+ / -
Prüfung
Test
1
2
3
5
4
6
7
8
9
10
1
2
3
4
Prüfling
Test Object
Programme
selector switch
Test circuit
selector switch
Polarity
selector switch
ULV
in [ V ]
LLV
in [ V ]
Test circuit 1 ... 10
Test circuit 1 ... 10
2
4
1
3
1 2
3 4
1 2
3 4
E
E
1
1
2
3
4
E
1
2
3
4
E