PN 153-231-B www.formfactor.com ACP40-GSG-xxx Probes • 2
ACP40-GSG-xxx Probes
Observe the probe landing on the metal on the contact substrate. Raise the probe and adjust the planarization knob to
ensure that each finger in the probe tip leaves marks of the same size and depth.
Making Contact
The Air Coplanar probe is designed to be used with a nominal overtravel
(downward movement after initial touchdown) of 50-75μm. The resulting
skate (forward movement resulting from overtravel) is about 20-30μm.
To obtain contact on extremely non-planar surfaces, you can use up to
250μm of overtravel without damaging the tip, although increased
overtravel may reduce probe life.
Proper amount of overtravel for calibration on Impedance Standard
Substrates (ISS) can be set using alignment marks on the ISS.
Initial contact with the edge of the probe tips should be at the midpoint
between the outer flat edge and the internal apex. With proper skate the
probes will end up at the midpoint between the internal apex and the flag
points.
Accessories
Probe Verification
To
verify the performance of the probe, you can use the Probe Test feature of FormFactor's WinCal
TM
software. An active
cable calibration in the VNA and measurements of ISS Short, Open and Load standards are used to provide insertion
and return loss for the probe.
PN 101-190 Calibration ISS
PN 101-162 Precision microwave cable with 2.92mm (K™ compatible) coaxial connectors
PN 005-016 Verification ISS
PN 005-018 Contact substrate
Properly PlanarizedNot Planarized
Probe in
the air
Probe at intial
touchdown
Probe
overtravel/skate
Overtravel
Skate
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