4-9. Available Softkeys on the CORRECTION Page . 4-20
4-10. Stray Admittance . . . . . . . . . . . . . . 4-21
4-11. OPEN/SHORT Correction Using The Interp olation
Metho d . . . . . . . . . . . . . . . . . 4-22
4-12. Residual Impedance . . . . . . . . . . . . . 4-23
4-13. OPEN/SHORT/LOAD Correction . . . . . . . 4-25
4-14. CORRECTION Page Example . . . . . . . . . 4-33
4-15. Available Fields on the LIMIT TABLE SETUP Page 4-35
4-16. Available Softkeys on the LIMIT TABLE SETUP
Page . . . . . . . . . . . . . . . . . . . 4-36
4-17. Swap Parameter Function . . . . . . . . . . . 4-37
4-18. Tolerance Mo de and Sequential Mo de . . . . . . 4-38
4-19. Limit Table Using the Sequential Mo de . . . . . 4-45
4-20. LIMIT TABLE SETUP Page Example . . . . . 4-47
4-21. Available Fields on the LIST SWEEP SETUP Page 4-49
4-22. Available Softkeys on the LIST SWEEP SETUP
Page . . . . . . . . . . . . . . . . . . . 4-50
4-23. SEQ mode and STEP mo de . . . . . . . . . . 4-51
4-24. List Sweep Settings . . . . . . . . . . . . . . 4-52
4-25. LIST SWEEP SETUP Page Example . . . . . . 4-55
5-1. Available Fields on the CATALOG Page . . . . 5-2
5-2. Available Softkeys on the CATALOG Page . . . 5-2
5-3. CATALOG Page Example . . . . . . . . . . . 5-4
5-4. Available Fields on the SYSTEM CONFIG Page . 5-6
5-5. Available Softkeys on the SYSTEM CONFIG Page 5-7
5-6. SYSTEM CONFIG page Example . . . . . . . 5-10
5-7. Available Fields on the SELF TEST Page . . . . 5-12
5-8. Available Softkeys on the SELF TEST Page . . . 5-12
6-1. Denition of Impedance . . . . . . . . . . . . 6-3
6-2. Vector Representation of Admittance . . . . . . 6-4
6-3. Capacitance Circuit Mo de Selection . . . . . . . 6-6
6-4. Inductance Circuit Mo de Selection . . . . . . . 6-7
6-5. Simplied Mo del of Signal Level and DUT . . . . 6-8
6-6. Four-Terminal Pair Measurement Principle . . . 6-9
6-7. Measurement Contacts . . . . . . . . . . . . 6-10
6-8. Mo del of Capacitance to Ground . . . . . . . . 6-11
6-9. Reducing Capacitance to Ground . . . . . . . . 6-12
6-10. Contact Resistance . . . . . . . . . . . . . . 6-13
6-11. Extending The Four-Terminal Pair Test Leads . . 6-13
6-12. Measurement Contacts for Test Leads Extension . 6-14
6-13. Example DUT Guard Plate Connection . . . . . 6-15
6-14. Guard Shield . . . . . . . . . . . . . . . . 6-15
6-15. Sample Shorting Plate . . . . . . . . . . . . 6-19
6-16. Shorting Plate Connection . . . . . . . . . . . 6-20
6-17. Parasitic Impedance Mo del (Using the HP
16047A/C/D) . . . . . . . . . . . . . . . 6-22
6-18. Typical Characteristics of Comp onents . . . . . 6-23
6-19. Connecting the HP 16047A . . . . . . . . . . 6-25
6-20. Connecting A Shorting Bar . . . . . . . . . . 6-26
6-21. Connecting DUT . . . . . . . . . . . . . . . 6-26
6-22. Measurement Results of A 470 pF Capacitor .
. . 6-27
Contents-17