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Observe warnings and precautions for user and instrument safety, including power, moving parts, and chip handling.
Explains Atomic Force Microscopes using sharp tips for force measurement and 3D surface reconstruction via raster scanning.
Details single-chip AFM (sc-AFM) integrating components onto a MEMS chip for ultra-precise scanning and sensing.
Lists nGauge AFM system components: stage, sample platform, power, USB cable, tweezers; requires a computer.
Covers nGauge AFM tapping mode, scanning limits (20x20x10um), and inability to image liquid or handle surface charging.
Recommendations for AFM setup: flat surface, minimal vibrations, and away from air drafts to ensure optimal performance.
Step-by-step guide for setting up the nGauge AFM: component removal, power/USB connections, and stage preparation.
Instructions for installing nGauge AFM software from USB/download: executable for Windows, disk image for macOS.
Guide to launching nGauge, verifying 'AFM Ready' status, and navigating Sweep, Approach, and Scan tabs.
Steps for sample placement, software launch, and initiating auto-approach to engage tip with sample for imaging.
Setting image resolution, scan speed, and applying corrections (e.g., line leveling) for clearer AFM topography, phase, or error images.
Guidance on extracting quantitative data like feature height, width, or RMS roughness from scanned AFM images.
Introduction to Gwyddion, an open-source AFM image post-processing tool, and its common data analysis functions.
Troubleshooting steps for computer detecting no AFM hardware: focus on USB connection and driver installation.
Solutions for a non-moving stage: check connections, software, override controls, and contact support if issues persist.
Guidance for auto-approach failures: ensure AFM chip resonance, check setup, and verify chip affixation.
Fixing flat/noisy frequency sweep data: adjust thumb nut for better connection, check AFM chip integrity.
Adjust Cantilever Drive Amplitude for optimal frequency sweep peak values; recommended ranges are provided.
Addresses image line-to-line height variations from sample instability or air drafts; suggests securing samples.
Solutions for noisy images: minimize vibrations, air drafts, and manage potential surface charging issues.
Explains data 'plateaus' relating to Z actuator range and potential image clipping with tall sample features.
Tune PI controller's Proportional and Integral coefficients for stable sample tracking and improved image quality.
Advanced frequency sweep parameters: start/stop frequency, step size, manual sweep, and cantilever drive amplitude adjustment.
Advanced approach controls: Proportional, Integral, Setpoint, Enable/Disable, and Z Coarse for precise tip positioning.
Advanced scan settings: Scan Mode, Leveling Direction, Leveling, Z Coarse, Proportional, Integral, Setpoint, Enable/Disable.
Menu controls: Motor Controls, PID Controller, DACs, PGAs, ADCs, Resistances, DDS, and Safety Configurations.
Check and update software/firmware: links and procedures for maintaining current versions.
Advanced software features: Lock Button, Force Curve, Reset AFM, Restore Defaults, and firmware update procedures.
General| Brand | ICSPI |
|---|---|
| Model | nGauge AFM |
| Category | Microscope |
| Language | English |
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