LEITZ SM-LUX-POL - User Manual

Describes the microscope stand and its function.

Details the rotating object stage, its size, and features.

Explains the revolving nosepiece and compensator slot.

Discusses alternative object stages and their mounting.

Instructions for mounting specific items for investigation.

Information on strainfree objectives for polarized-light microscopy.

Details on PERIPLAN widefield eyepieces for binocular observation.

Step-by-step guide for attaching microscope tubes.

Procedure for setting up the condenser and focusing the optical system.

Steps to align the polarizer and analyser for proper operation.

Procedure for centering the microscope illuminator lamp.

Explains the application of 1/4 and-plates for optical analysis.

Details on using the lambda-plate for weak birefringence.

Methods for measuring phase differences using adjustable compensators.

Description of the Brace-Köhler compensator and its application.

Information on the Senarmont compensator and its measurement range.

Details of the tilting compensator M for phase difference measurement.

Information on the tilting compensator K for extended phase difference measurement.

Steps for operating the microscope for conoscopic observation.

How to determine the optical character of crystals using microscopy.

Specific methods for determining optical character in uniaxial crystals.

Procedures for determining optical character in biaxial crystals.

Using circular polarization for observing all objects simultaneously.

Details on the Pol-interference contrast device R for surface relief.

Instructions for converting the microscope for incident light observation.

Steps for adjusting the microscope after attaching the incident-light device.