- 130 -
LGE Internal Use Only Copyright © 2009 LG Electronics. Inc. All right reserved.
Only for training and service purposes
4. TROUBLE SHOOTING
Check 3. 26MHz at BB part
Figure 4-19. Schematic (26MHz at BB Part)
Figure 4-20. 26MHz at TP1
Figure 4-18. Test point (26MHz at BB part)
Test Point (Crystal Part)
Test Point (Crystal Part)
MCLK
TP1
WTXIN
24
23
WTXLP
WTXQN
26
25
WTXQP
XON
17
18
XOP
MCLKSEC
20
STR
10
13
TESTOUT
VCCD
21
D9
MCLK
15
CLK
12
14
CLKREQ
11
DATA
DNIR148
R150DNI
2
GND1
GND2
4
1
HOT1
HOT2
3
26MHzTN4-26562
X100
R149DNI
0R144
MCLK
RF_CTRL_CLK
RF_CTRL_DATA
RF_CTRL_STR_1
TESTOUT
MCLKREQ
R200 3.3K
RTCCLKIN
A15
SYSCLK0
A18
A17
SYSCLK1
SYSCLK2
A19
B18
SYSCLKREQN
E17
MCLK
MCLKREQ
B17
MSACCIRQN
C19
MSAPPIRQN
C20
BT_CLKREQ_n
MCLK
SYSCLK0
SYSCLK1
USB_XTAL1
RTCCLK
ACC_IRQ_n
APP_IRQ_n
MCLKREQ
TP1
DB3200
RF3300