Nokia 6310i - Page 44

NPL-1
2 - Baseband System PAMS Technical Documentation
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)/$6+
DQG9
,2
9
)/$6+
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,2
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GHVFULEHGEHORZ
1
This test pattern is used for R&D purpose only and is not possible to recreate by end user.
/&'%DFNOLJKW
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7KH/('GULYHUFLUFXLWLVVKRZQEHORZLQ)LJXUH/('GULYHUFLUFXLWIRUGLVSOD\DQGNH\
OLJKW7KHYROWDJHGURSRYHU5SURGXFHVDFRQVWDQWFXUUHQWRIP$LHP$SHU
/('
7KH8(0RXWSXWSLQ'/,*+7FRQWUROVWKHGULYHUFLUFXLW7KLVRXWSXWLVDQRSHQGUDLQ
GULYHU7KHRXWSXWIUHTXHQF\LV+]DQGWKHGXW\F\FOHFDQEHFKDQJHGIURP¤
ZLWKELWUHVROXWLRQ%\FKDQJLQJWKHGXW\F\FOHRIWKH3:0VLJQDOLWLVSRVVLEOHWR
FKDQJHWKHDYHUDJHFXUUHQWRIWKH/('V
7DEOH/&'FXUUHQWFRQVXPSWLRQ
Typ Max Unit/Note
I
total
250 400
µA @ +25
o
C
I
total
=I
DD
+I
DDI
I
total
is measured with normal mode test pattern.
400
µA @ T
op
, measured with normal mode test
pattern.
900 1300
µA using worst case test pattern @25 °C
1
Active area
96 x 65
Driver
SEG 0 SEG 95
COM 0COM 64
Top View
Viewing area
C
C C
FPC
Au Connector pads
Figure 12 LCD module.