6
RESISTANCE MEASUREMENT
1) Plug the test leads into the positive and COM sockets.
2) Place the range selector to the preferred range position.
3) Short the test leads and adjust the resistance dial so the indicator sits at the
0 position.
4) Make sure there is no voltage across the circuit to be tested.
5) Connect the test leads to the tested resistor, then read the scale in
accordance with the reference table (on page 7).
TRANSISTOR TEST
ICEO leakage current test
1) Plug the test leads into the positive and -COM sockets.
2) Set the range selector to X10 (15mA) for small size transistors, or X1
(150mA) for large size transistors.
3) Adjust the resistance dial so the indicator points to 0 on the Ω scale.
4) Connect the transistor to the multimeter:
i) When working with NPN transistors, ensure the ‘N’ terminal of the
tester is connected with the Collector(C) of the transistor, and the ‘P’
terminal is connected with the Emitter(E) of the transistor.
ii) When working with PNP transistors, ensure the ‘P’ terminal of the tester
is connected with the Collector(C) of the transistor, and the ‘N’ terminal
is connected with the Emitter(E) of the transistor.
5) Read the iceo range. If the pointer is not within the LEAK zone, or the
pointer moves up near the full scale, the transistor tested is not performing
as designed.
HFE (DC AMPLIFICATION) TEST
1) Set the range selector to X10.
2) Adjust the resistance dial so the indicator sits at the 0 position.
3) Connect the transistor to the multimeter:
i) For NPN transistors, connect the ‘P’ terminal of the tester to the emitter
of the transistor with the hFE test lead. Plug the hFE connector into the
‘N’ terminal, then connect its red clip to the collector, and the black clip
to the base of the transistor.
ii) For PNP transistors, connect the ‘N’ terminal of the tester to the emitter
of the transistor. Plug the hFE connector into the ‘P’ terminal, then
connect its red clip to the collector, and the black clip to the base of the
transistor.
4) Read the hFE scale. The value of the reading is Ic/Ib, which is the DC
amplication degree of the transistor tested.
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