How to readjust sensor probe to probe offset in TAKAYA Test Equipment?
To resolve an unsuitable sensor probe to probe offset on your TAKAYA Test Equipment, readjust the sensor probe to probe offset using the following setting: Option Mode>IC Open>Sensor Probe/Probe Offset.
Explains the notation for keys and switches used in the manual.
Defines symbols used to convey safety information and warnings.
Describes the functionality of the IC Open Test system CS-9500.
Lists the hardware components of the CS-9500 system.
Shows the physical installation of hardware within the tester.
Explains the fundamental measurement principle of the IC open test.
Details the installation of the antenna drive unit and sensor probe.
Guides on selecting appropriate contact points for sensor probes on IC solder pads.
Explains how reference values are learned for PASS/FAIL judgment.
Describes how to program IC Open test steps using the tester.
Lists IC types and conditions that are measurable by the system.
Details ICs and conditions that cannot be measured or may cause issues.
Provides an estimate of the test speed based on IC pitch and travel distance.
Specifies the physical dimensions of the sensor probe's operational area.
Lists various technical specifications of the sensor probe system.
Guides on the initial setup and calibration of sensor probes.
Explains the automated creation of IC open test programs.
Details how to program IC open tests using the teaching system.
Details how to program IC open tests using the point system.
Covers inputting and examining reference values for IC open tests.
Describes how to convert electric test steps to IC open test steps and vice versa.
Outlines converting multiple IC open test steps into electric test steps.
Describes how to input reference values for IC open tests.
Explains how to examine measurement conditions for IC open tests.
Explains how PASS/FAIL judgment is performed based on reference values and tolerances.
Discusses conditions that make IC open measurement difficult or impossible.
Details converting electric test steps to IC open test steps and vice versa.
Describes the maintenance and replacement of the sensor probe base.
Explains how to set the lifetime limit for sensor probes.
Lists inspection points, failures, and recommended actions for sensor probes.
Offers solutions for common issues encountered during IC open testing.
Provides a procedure for replacing the CS9000-A24 sensor probe.
Details the procedure for replacing the CS8000-S21 sensor probe base.
Provides a brief overview of the CSU-9500 system.
Lists the hardware components of the Underside IC Open Test System CSU-9500.
Shows the physical area for placing bottom sensor plates on the tray.
Specifies the maximum height limitation for IC packages when using bottom sensor plates.
Covers test programming for the Underside IC Open Test system.
Details the procedure for installing bottom sensor plates.
Configuration of bottom sensor settings and their positions.
Explains the creation of test programs for the bottom IC open test.
General| Model Series | APT-9411 Series |
|---|---|
| Minimum Pad Size | 50 μm |
| Minimum Test Pad Size | 50 μm |
| Type | Flying Probe Tester |
| Maximum Board Size | 610mm x 510mm (24" x 20") |
| Test Current | N/A (Non-powered) |
| Measurement Capabilities | Resistance, Capacitance, Inductance, Diode |
| Capacitance Measurement Range | 0.1 pF to 100 μF |
| Inductance Measurement Range | 1 μH to 10 H |
| Interface | Ethernet |
| Power Supply | 50/60Hz |
| Test Voltage | N/A (Non-powered) |
| Test Voltage Range | N/A (Non-powered) |
| Test Current Range | N/A (Non-powered) |
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