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Steps and requirements for professional installation of the microscope.
Guidelines on using original spare parts and authorized repair services.
Procedure for imaging non-conductive samples in low vacuum using the LVSTD detector.
Details the In-Beam SE detector for improved resolution at short working distances.
Instructions on logging into the MiraTC software and initializing the microscope.
Detailed procedure for safely exchanging specimens in the microscope chamber.
Procedure for imaging non-conductive samples in low vacuum using the LVSTD detector.
Steps for achieving the best resolution using high accelerating voltage and short working distance.
General| Type | Scanning Electron Microscope (SEM) |
|---|---|
| Electron Source | Schottky field emission gun |
| Resolution | 1.0 nm |
| Resolution (SE) | 1.0 nm |
| Resolution (BSE) | 2.5 nm |
| Accelerating Voltage | 200 V - 30 kV |
| Detectors | SE, BSE, EDS, WDS |
| Vacuum System | Turbo-molecular pump |
| Beam Current | 1 pA - 200 nA |
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