OVERVIEW VOLTECH AT3600 USER MANUAL
PAGE 1.3.2 VPN 98-024 INTRODUCTION
BEHIND THE FRONT PANEL
The internal functionality of the AT3600 tester is summarized in the following figure:
You do not need to know how each block functions in order to use the tester. The
following explanation is included for readers who wish to know more.
Test Nodes
These are the spring-loaded ATE pins that can be seen on the top surface of the tester.
Each node is made up of two contacts - a ‘power’ pin, and a ‘sense’ pin - forming a Kelvin pair.
Relay Switching Matrix
The purpose of the relay-switching matrix is to connect the selected test source and
measurement circuits to the particular nodes required in the test.
The matrix is a crucial component in the performance of the AT Series tester. It is made up of
very advanced, high speed, high voltage reed relays, capable both of holding off the 7000V test
voltages used in Hi Pot tests, and of accurately switching the very small voltages and currents
encountered in other tests. (Lower voltage rating relays are used on the AT1600).
The switching of the relays is carefully controlled by the processors so that there is no arcing
across the contacts. This means that the life of the relays can be guaranteed to last for many
millions of switching operations.
Processors
The AT Series Testers are based on a two-processor design:
A standard microprocessor which acts as controller, and also drives the relay matrix, the
keyboard and display, and the various interfaces.
A fast digital signal processor that controls the test sources and performs the measurements.
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