Agilent Technologies 8504B - Page 257

FINAL TRIM SIZE : 7.5 in x 9.0 in
Characteristics
Compatible
ber
1
9/125

m
.
Source
Characteristics
1300
nm
1550
nm
P
eak
Wavelength
1308
6
30 nm
1550
6
30 nm
Spectral
Width
2
53
nm
55
nm
A
verage
P
ower
3
0
17
dBm
0
17
dBm
Measurement
span
4
1
to 400
mm
.
Sweep
Speed
(scan
rate)
1300
nm
source
18
mm/sec
(56
msec/mm)
1550
nm
source
21
mm/sec
(47
msec/mm)
1
Useful
measurements
are
achievable
with
other
ber
types,
but
measurement
performance
ma
y
not
be
optimum.
2
Spectral width
is at
full width,
half-maximum.
3
A
verage
power
levels
are
measured
at
the
front-panel
TEST POR
T connector
.
4
This
is
the
equivalent
distance
in
air
,
and
can
be
oset
b
y
using
ber
extension cables.
Return Loss
Uncertainty
1
P
olarization
Sensitivity
6
0.75
dB
Amplitude
Flatness
V
ersus
Mirror
P
osition
6
1.0
dB
Dispersion
Eects
6
0.3
dB
1
All
these
items
are
independent,
and
their
eects
are
combined
using
a
root-sum-of-the-square
method.
6-14
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